segunda-feira, 10 de novembro de 2014
Electronic measurement in nanotechnology and microelectronics Dyakonov V.
Title: Electronic measurement in nanotechnology and microelectronics
Author: Athos AA Dyakonov V.
Publisher: DMK Press
Size: 47.0 MB
Russia's first monograph on the most advanced electronic and electrical radio measurements and measuring instruments used in research, testing and test equipment and systems, microelectronics and nanotechnology. For the first time in detail the means of measurement applied in a large-scale microelectronic production and instruments leading to their developing and manufacturing firms: Keithley, Tektronix, Agilent Technologies, LeCroy, R & S and others. Particular attention is paid to the analysis and generation of test signals, measurement of their parameters in small and micro time measured by ultra low currents and voltages, impedance analysis and immittance circuits, measurement of static and dynamic characteristics of semiconductor devices and integrated circuits and others. It is the largest survey of contemporary foreign and domestic instruments in the market of Russia and the world. For engineers, scientists, graduate students, teachers and students of universities and technical universities and classical types.