Method to Prevent the Malfunction Caused by the Transformer Magnetizing Inrush Current using IEC 61850-based IEDs and Dynamic Performance Test using RTDS Test-bed - Kang, Hae-Gweon

Abstract – The digital substations are being built based on the IEC 61850 network. The cooperation and protection of power system are becoming more intelligent and reliable in the environment of digital substation. This paper proposes a novel method to prevent the malfunction caused by the Transformer Magnetizing Inrush Current(TMIC) using the IEC 61850 based data sharing between the IEDs. To protect a main transformer, the current differential protection(87T) and over-current protection(50/51) are used generally.
LINK
http://www.koreascience.or.kr/search/articlepdf_ocean.jsp?url=http://ocean.kisti.re.kr/downfile/volume/kiee/E1EEFQ/2014/v9n3/E1EEFQ_2014_v9n3_1104.pdf