AUTOR DO BLOG ENG.ARMANDO CAVERO MIRANDA SÃO PAULO BRASIL

"OBRIGADO DEUS PELA VIDA,PELA MINHA FAMILIA,PELO TRABALHO,PELO PÃO DE CADA DIA,PROTEGENOS DO MAL"

"OBRIGADO DEUS PELA VIDA,PELA MINHA FAMILIA,PELO TRABALHO,PELO PÃO DE CADA DIA,PROTEGENOS  DO MAL"

“SE SEUS PROJETOS FOREM PARA UM ANO,SEMEIE O GRÂO.SE FOREM PARA DEZ ANOS,PLANTE UMA ÁRVORE.SE FOREM PARA CEM ANOS,EDUQUE O POVO.”

“Sixty years ago I knew everything; now I know nothing; education is a progressive discovery of our own ignorance. Will Durant”

https://picasion.com/
https://picasion.com/

sexta-feira, 29 de julho de 2022

MODELO DE CÁLCULO DE PERDAS POR COMUTAÇÃO E MÉTODO DE SELEÇÃO DE TECNOLOGIAS DE TRANSISTORES FET APLICADOS A CONVERSORES ESTÁTICOS-Edemar de Oliveira Prado- Dissertação (mestrado) – Universidade Federal de Santa Maria, Centro de Tecnologia, Programa de Pós-Graduação em Engenharia Elétrica, RS, 2020-BRASIL









 ABSTRACT
 SWITCHING LOSSES CALCULATION MODEL AND METHOD FOR SELECTING FET TRANSISTOR TECHNOLOGIES APPLIED TO STATIC CONVERTERS 
Author: Edemar de Oliveira Prado 
Advisor: José Renes Pinheiro 

This dissertation presents an analytical model to assist in the calculation of switching losses and a methodology for selecting MOSFETs that with breakdown voltages greater than 100 V. The model was developed based on physical and electrical concepts of the FET structure, considering non-linearities of Miller capacitance as a function of voltage variation, mainly present in MOSFETs manufactured to operate in voltages above 100 V. Simulation and experimental results that validate the model were obtained, considering the frequency range of 1 - 300 kHz, at which the limit of gate driver operation has been reached. The proposed model was compared to other loss calculation models frequently used in the literature, where it was observed that other models show an increase in the relative error for frequencies above 50 kHz. Heat transfer systems are analyzed and discussed. The proposed loss calculation model is used in the development of a comparative analysis between the technologies of conventional Silicon MOSFET, superjunction, SiC and GaN. The impact of stray capacitances, junction temperature, intrinsic resistances, switching frequency and power levels in each technology are analyzed. Application trend areas are defined for each technology based on yields as a efficiency of frequency and power.
VIEW FULL THESIS:

Nenhum comentário:

Postar um comentário